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Showing results: 256 - 270 of 296 items found.

  • USB-6289, 32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device

    780056-01 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device - The USB‑6289 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PCI-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device

    779546-01 - NI

    80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6255 offers analog I/O, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    779959-01 - NI

    80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6255 offers analog I/O, digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    779958-01 - NI

    80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6255 offers analog I/O, digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    779959-04 - NI

    80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6255 offers analog I/O, digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXI-6289, 32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Hybrid, Multifunction I/O

    779639-01 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6289 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXI-6289, 32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module

    779123-01 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6289 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6289, 32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device

    780056-04 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device - The USB‑6289 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6289, 32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device

    780055-01 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device - The USB‑6289 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6289, 32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device

    780055-04 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device - The USB‑6289 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6289, 32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device

    780056-06 - NI

    32 AI (18-Bit, 625 kS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device - The USB‑6289 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • High Temperature, Low Strain Capacitive Extensometers (1200 C or 1600 C)

    Model 3648 - Jinan Testing Equipment IE Corporation

    These extensometers use a high temperature capacitive sensor in combination with an innovative design to achieve high accuracy strain measurements in low measuring ranges not possible with other high temperature extensometers. They mount on a slide bracket (included) that can attach to the load frame of your test system; optional load frame mounting brackets are available. The overall design reduces any influence from common lab environment vibrations.The standard temperature version (to 1200℃) is supplied with high purity alumina rods. The high temperature option is furnished with alpha grade silicon carbide rods. Rods are made to order to the length required for your furnace. These units are made to order in many different gauge lengths and measuring ranges.The extensometer comes with a signal conditioner. The output is an analog DC voltage, factory calibrated with the extensometer to 0 to ±10 VDC typically. They are readily interfaced with most existing test controllers, and may be directly connected to data acquisition systems and chart recorders. Bringing the signal into a spare DC input channel (or external input) on the test controller allows the extensometer to be used for strain controlled tests like low cycle fatigue.

  • PXIe-7821, Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module

    783485-01 - NI

    Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7821 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.

  • PXIe-7820, Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module

    783484-01 - NI

    Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module—The PXIe‑7820 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7820 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7820 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.

  • PXIe-7822, PXI Express Digital RIO with Kintex-7 325T FPGA

    783486-01 - NI

    Kintex 7 325T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7822 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7822 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7822 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.

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